Facilities

Related Materials Synthesis and Processing*

N anoInk’s NLP 2000 Dip-Pen Nanolithography (DPN) system
Brookfield DV-II+Pro Viscometer
High-temperature furnaces (air and controlled-atmosphere <1700°C)
Tapecaster (Mistler) and screenprinter (DEK)
Computer-controlled laser cutter (Universal Laser Systems)
Precision CNC dicing saw 75 ton four-post heated platen uniaxial press (PHI)
Powder mills (roll and attrition mills)
Nanopowder autoclave reactor (Autoclave Engineers 300EZ)
Class 100, 1000, and 10,000 cleanrooms with photo- and e-beam lithography capabilities
Controlled-atmosphere glove box (Vacuum Atmosphere Company)
Vacuum/atmosphere controlled spin coater (Specialty Coating Systems P6700)
BET (Micromeritics ASAP 2020)Laser particle sizer (Malvern Mastersizer 2000S)
Nanopowder sizer (Malvern Zetasizer Nano-ZS)
Rheometer (Brookfield DV-III Ultra)
Intrusion Mercury Porosimeter (Micromeritics Autopor IV)
ULPA laminar flow hoods (ESCO)Rotavapor system (Buchi R-205)
Electron beam evaporator (BOC Temescal BJD-2000)
Sputtering station (CVC 610)PECVD (Oxford 80+ Ionfab)
LPCVD furnace (Tystar Mini-Tytan)Wedge-wedge and ball-wedge bonder (West Bond 747677E)
Hyrel 3D Engine SR Printer
Mechanical Polisher: Pace technologies Giga 0900 vibratory polisher, Pace technologies Nano 1000T grinder polisher

Current-voltage-power (I-V-P) testing setup for fuel cells, sensors and batteries.
Electrical testing in various gases and fuels (Air, O ₂, H ₂, N ₂, CO, CO ₂, H ₂O, CH ₄) with various impurities (H ₂S, PH ₄, HCl)
Automated 4-probe conductivity and Seeback coefficient stands for testing at various temperatures and pO ₂ levels
PEM single-cell and three-cell stack testing (ElectroChem MTS-150 PEM electrical loads with HSA humidity control)
Fuel cell planar test stands for large area cells (30-100 cm ² active area)
Solartron 1260 and 1287 impedance/gain-phase analyzer with potentiostat
Digital multi-meters (Keithley 2000)
DC power supplies and loads (BK Precision)
Probe Stations (Rucker and Coles models 680, 666, 660 and 260)
Uniaxial mechanical testing systems (MTS Material Test System 810, Instron 3365)
LCR meters: BK precision 889B and Agilant E4980a
Sun Systems Controlled Temperature (-200 to 800°C) Environmental Chamber
TA Instrument DMA Q800 - Temperature Controlled Dynamic Mechanical Analyzer
Stellar Net Raman Spectrometer: 532 nm (Green light) Laser Module

X-ray Photoelectron spectroscopy (XPS- PHl 5000 VersaProb eTM)
Multifunctional scanning probe microscopy (PicoSPM® II)
Fourier Transform Infrared Spectroscopy (FTIR) with UMA 600 Microscope (DIGLAB FTS7000)
UV-Vis spectrometer equipped with the integration spheres accessory (Shimadzu 2550)3-D Hi-Scope Microscope (enables 360 degree dynamic rotation with oblique viewing)
Optical Microscope coupled with CCD camera (Leitz)
Atomic Force Microscopy (AFM)- (tapping, conductive, and electrochemical)
Electrostatic force microscopy (EFM)
Magnetic force microscopy (MFM)
Scanning tunneling microscopy (STM)
X-ray Diffractometer (XRD) (Bruker D8 Unit with heated stage and Panalytical X'Pert Powder)
JEOL 7600F Scanning Electron Microscope (SEM)/Oxford EDS and NPGS E-beam lithography software
Hitachi S4700 FE-Scanning Electron Microscope (SEM)/EDAX Energy dispersive X-ray Detector (EDX)
TEM sample preparation equipments including Model 1010 Ion-Mill from Fischione, MultiPrep™ System for semi-automatic polishing from Allied Hightech, TechCut 4™ Low Speed Saw from Allied Hightech, AxioImage light microscope with digital imaging from Zeiss, and Stereo Microscope.
JEOL JEM-2100 High Resolution Transmission Electron Microscope (HRTEM) (will be installed in September 2009), point-to-point resolution of 0.23nm, high tilting capabilities, CCD camera digital imaging for electron diffraction, diffraction contrast and HRTEM imaging.

* Some equipment available through WVNano user facility